VALENCE-BAND REGION XPS, AFM AND NEXAFS SURFACE-ANALYSIS OF LOW-PRESSURE DC OXYGEN PLASMA-TREATED POLYPROPYLENE

Citation
T. Gross et al., VALENCE-BAND REGION XPS, AFM AND NEXAFS SURFACE-ANALYSIS OF LOW-PRESSURE DC OXYGEN PLASMA-TREATED POLYPROPYLENE, Polymer, 35(25), 1994, pp. 5590-5594
Citations number
11
Categorie Soggetti
Polymer Sciences
Journal title
ISSN journal
00323861
Volume
35
Issue
25
Year of publication
1994
Pages
5590 - 5594
Database
ISI
SICI code
0032-3861(1994)35:25<5590:VRXAAN>2.0.ZU;2-7
Abstract
Biaxially stretched polypropylene (PP) foils treated with oxygen plasm a at low pressure were analysed by core level and valence band region X-ray photoelectron spectroscopy (XPS), atomic force microscopy and ne ar edge X-ray absorption fine structure (NEXAFS) spectroscopy. Applyin g short treatment times the XPS O C atomic ratios are less than or equ al to 0.1. Valence band electron spectroscopy for chemical analysis (E SCA) and NEXAFS spectroscopy reveal that a certain number of C-O and a smaller amount of C=O functionalities together with C=C bonds exist a t a short-time treated PP surface. These species were not observed or resolved by a standard core level XPS analysis of the same surface. Th e surface is smoothed by the plasma treatment and the C-O and C=O bond s are slightly non-statistically oriented (parallel to the surface pla ne). Considering the results obtained after prolonged plasma treatment , NEXAFS spectroscopy provides a direct indication for the formation o f conjugated carbon double bonds in the surface region of the PP sampl es.