ATOMIC MOTION-INDUCED BY A SCANNING TUNNELING MICROSCOPE TIP ON THE SI(111) SURFACE

Citation
T. Nakayama et al., ATOMIC MOTION-INDUCED BY A SCANNING TUNNELING MICROSCOPE TIP ON THE SI(111) SURFACE, Surface science, 320(3), 1994, pp. 120000101-120000104
Citations number
6
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
320
Issue
3
Year of publication
1994
Pages
120000101 - 120000104
Database
ISI
SICI code
0039-6028(1994)320:3<120000101:AMBAST>2.0.ZU;2-H
Abstract
Using scanning tunneling microscopy (STM), we have observed the STM-ti p-induced atomic motion of the Si adatoms in the Si(111)-(7x7) surface structure near out-of-phase boundaries in the structure. In order to excite the motion of si adatoms, the tip was fixed at a certain height at every pixel in the lateral scan and the sample bias was changed st epwise. Although the motion of Si adatoms occurs in a complicated mann er, analysis shows that its elemental process is quite simple. Namely, the Si adatom jumps from an occupied T-4 site to an unoccupied T-4 si te.