P. Vandenbrande et al., DETERMINATION OF THE CHEMICAL AND PHYSICAL-PROPERTIES OF HYDROGENATEDCARBON DEPOSITS PRODUCED BY DC MAGNETRON REACTIVE SPUTTERING, Surface & coatings technology, 68, 1994, pp. 656-661
Hydrogenated carbon deposits on silicon substrate have been prepared b
y magnetron-enhanced reactive sputtering in a C2H2-Ar gas mixture with
a carbon autofeeding target system. The hydrogen content and the dens
ity of the hydrogenated carbon deposits have been determined by elasti
c recoil detection analysis and related to the C2H2:Ar gas flow ratio.
The characteristics of carbon-hydrogen and carbon-carbon bonds have b
een investigated by Fourier transform IR spectrometry. The mechanical
properties were investigated by nanoindentation. This systematic study
reveals a dependence of film properties on gas composition. This depe
ndence can be used to tune film properties to specific applications. A
s the acetylene flow increases, the hydrogen concentration increases,
and films have a decreasing density, decreasing hardness and decreasin
g Young's modulus.