V. Michalik et D. Frankenberg, SIMPLE AND COMPLEX DOUBLE-STRAND BREAKS INDUCED BY ELECTRONS, International journal of radiation biology, 66(5), 1994, pp. 467-470
Citations number
13
Categorie Soggetti
Radiology,Nuclear Medicine & Medical Imaging","Nuclear Sciences & Tecnology
Biophysical modelling of DNA damage based on Monte Carlo simulation of
charged particle tracks allows to describe radiation induced double-s
trand breaks (dsb) in a quantitative and qualitative way. Experimental
and calculated data suggest that in the electron energy range from 50
eV to 1MeV dsb can be grouped in simple and complex dsb. Complex dsb
are mainly produced by low energy electrons with initial energies betw
een similar to 200 and similar to 500eV, whereas simple dsb are prefer
entially induced by energy transfers <200eV, which produce at least tw
o ionizations.