T. Takahasi et al., MULTIELEMENTAL SEMIQUANTITATIVE ANALYSES OF SUSPENDED PARTICULATE MATTER BY GLOW-DISCHARGE MS, Bunseki Kagaku, 43(12), 1994, pp. 1083-1086
We report the possibilities for multi-elemental analysis of suspended
particulate matter (SPM) by glow discharge mass spectrometry (GDMS). T
o cope with the small sample volume, SPM sample was deposited on the s
urface of a high purity (7N grade) indium electrode. NIST SRM 1648 Urb
an Particulate Matter was analyzed to evaluate the method. For 34 elem
ents, GDMS results agreed well with their reference values within a fa
ctor of 2 from the major constituents (12.5 wt% of Si) to the trace co
nstituents (down to 0.8 mu g/g of Eu), even when using typical relativ
e sensitivity factors (RSF). A total of 53 elements including halogens
were analyzed using approximately 10 mg of SPM sample by GDMS with su
b-mu g/g sensitivity.