AN INVESTIGATION OF DOPED POLYPYRROLE BY A COMBINATION OF SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPES

Authors
DIETLER G HEUBERGER M TRESCH S BUJARD P
Citation
G. Dietler et al., AN INVESTIGATION OF DOPED POLYPYRROLE BY A COMBINATION OF SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPES, Synthetic metals, 67(1-3), 1994, pp. 211-214
Citations number
5
Categorie Soggetti
Physics, Condensed Matter","Metallurgy & Mining
Journal title
Synthetic metals → ACNP
ISSN journal
03796779
Volume
67
Issue
1-3
Year of publication
1994
Pages
211 - 214
Database
ISI
SICI code
0379-6779(1994)67:1-3<211:AIODPB>2.0.ZU;2-Y
Abstract
In this paper the results obtained by a combination of the scanning tu nnelling microscope (STM) and of the atomic force microscope (AFM) on a polypyrrole sample doped by a sulfonated poly(beta-hydroxyether) mat rix are presented. On the sample surface the existence of domains with very different conductivity is observed. These domains also exhibit a pressure-dependent conductivity which can be evidenced by curves of c urrent versus distance and force versus distance recorded with the AFM /STM combination.