ESR STUDIES OF SEMICONDUCTOR-DOPED GLASSES

Citation
S. Omi et al., ESR STUDIES OF SEMICONDUCTOR-DOPED GLASSES, Journal of non-crystalline solids, 178, 1994, pp. 129-134
Citations number
10
Categorie Soggetti
Material Science, Ceramics
ISSN journal
00223093
Volume
178
Year of publication
1994
Pages
129 - 134
Database
ISI
SICI code
0022-3093(1994)178:<129:ESOSG>2.0.ZU;2-7
Abstract
Electron spin resonance of semiconductor-doped phosphate glasses has b een measured at 77 K. Three types of signal are induced with precipita tion of semiconductor nanocrystals in glass host materials. Two of the m are attributed to glass defects around semiconductor nanocrystals an d the other to S vacancies in CdS nanocrystals. The increase in electr on spin resonance absorption with Ar-ion laser irradiation reveals tha t carriers photoexcited in nanocrystals are trapped not only on nanocr ystal defects but also glass defects.