SCANNING-TUNNELING-MICROSCOPY STUDY OF THE THICK-FILM LIMIT OF KINETIC ROUGHENING

Citation
G. Palasantzas et J. Krim, SCANNING-TUNNELING-MICROSCOPY STUDY OF THE THICK-FILM LIMIT OF KINETIC ROUGHENING, Physical review letters, 73(26), 1994, pp. 3564-3567
Citations number
32
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
73
Issue
26
Year of publication
1994
Pages
3564 - 3567
Database
ISI
SICI code
0031-9007(1994)73:26<3564:SSOTTL>2.0.ZU;2-N