I. Bitensky et al., PLASMA DESORPTION MASS-SPECTROMETRY IN STUDIES OF FORMATION AND SPUTTERING OF FULLERENES BY MEV ATOMIC IONS, International journal of mass spectrometry and ion processes, 138, 1994, pp. 159-172
Citations number
35
Categorie Soggetti
Spectroscopy,"Physics, Atomic, Molecular & Chemical
An account is presented on plasma desorption mass spectrometry (PDMS)
studies of different carbon-containing organic solids utilizing megael
ectronvolt (MeV) atomic ions from the Uppsala EN-tandem accelerator. P
ositive ions of even-numbered carbon clusters (C-n(+), n = 40 to >200)
are ejected as a result of the interaction of the fast MeV ions with
the target. The distribution of cluster sines suggests that stable, cl
osed carbon-cage structures - fullerenes - are formed. Among the inves
tigated materials that produce carbon clusters are poly(vinylidenefluo
ride) and fluorinated fullerenes - C60F2m. For comparison purposes dat
a from C-60 targets have been also collected and analyzed. PDMS has be
en used for the in situ assessment of the damaging of C-60 films by Me
V heavy ions. Results on delayed electron emission from C-60(-) sputte
red by MeV ions from C-60 fullerene targets are also presented. A mode
l of fullerene formation as a result of MeV ion interactions with the
organic solid, including the yield dependence on primary ion charge st
ate, is summarized. Both the data and the model suggest that fullerene
s are formed as a result of a single primary ion impact and that they
are ejected from an axially expanding infratrack plasma region. Result
s on different types of coalescence reactions in synthetic C-60 fuller
ene targets and in blends of pure (synthetic) C-60 With polystyrene le
ading to ejection of higher mass positive fullerene ions (C-k(+), K fr
om 60 to more than 200) are also reported. The coalescence reactions a
re induced by the interaction of a single MeV ion with the solid. We a
rgue that our data contribute to elucidating some general patterns of
the fullerene formation mechanism.