TRIPLE AXIS X-RAY-INVESTIGATIONS OF SEMICONDUCTOR SURFACE CORRUGATIONS

Authors
DARHUBER AA KOPPENSTEINER E STRAUB H BRUNTHALER G FASCHINGER W BAUER G
Citation
Aa. Darhuber et al., TRIPLE AXIS X-RAY-INVESTIGATIONS OF SEMICONDUCTOR SURFACE CORRUGATIONS, Journal of applied physics, 76(12), 1994, pp. 7816-7823
Citations number
26
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
76
Issue
12
Year of publication
1994
Pages
7816 - 7823
Database
ISI
SICI code
0021-8979(1994)76:12<7816:TAXOSS>2.0.ZU;2-5