ELECTRON-SPIN-RESONANCE EVIDENCE FOR AN IMPURITY-RELATED E'-LIKE HOLETRAPPING DEFECT IN THERMALLY GROWN SIO2 ON SI

Authors
CONLEY JF LENAHAN PM EVANS HL LOWRY RK MORTHORST TJ
Citation
Jf. Conley et al., ELECTRON-SPIN-RESONANCE EVIDENCE FOR AN IMPURITY-RELATED E'-LIKE HOLETRAPPING DEFECT IN THERMALLY GROWN SIO2 ON SI, Journal of applied physics, 76(12), 1994, pp. 8186-8188
Citations number
34
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
76
Issue
12
Year of publication
1994
Pages
8186 - 8188
Database
ISI
SICI code
0021-8979(1994)76:12<8186:EEFAIE>2.0.ZU;2-T