We illustrate a procedure whereby the nonlinear optical response can b
e used to determine the strain distribution in properly engineered InG
aAs/GaAs multiple quantum well (MQW) structures with piezoelectric fie
lds along the growth direction. We do this by fabricating two p-i(MQW)
-n samples which are designed such that, if the materials are mechanic
ally clamped, the quantum well exciton of one will shift to the blue u
pon optical excitation, whereas the quantum well exciton of the other
will shift to the red. However, if the materials are mechanically free
, the quantum well excitons of both samples will shift to the red. We
illustrate the technique by determining that InGaAs/GaAs MQWs grown on
[111]-oriented GaAs substrates are (as expected) mechanically clamped
. That is, that we observe an excitonic blue shift in one sample, and
a red shift in the other.