DESIGN AND CERTIFICATION OF HIGH-PURITY DELIVERY SYSTEMS FOR SEMICONDUCTOR WAFER CLEANING CHEMICALS

Citation
Dc. Grant et al., DESIGN AND CERTIFICATION OF HIGH-PURITY DELIVERY SYSTEMS FOR SEMICONDUCTOR WAFER CLEANING CHEMICALS, Journal of the IES, 37(6), 1994, pp. 32-40
Citations number
NO
Categorie Soggetti
Environmental Sciences","Instument & Instrumentation","Engineering, Environmental
Journal title
ISSN journal
10522883
Volume
37
Issue
6
Year of publication
1994
Pages
32 - 40
Database
ISI
SICI code
1052-2883(1994)37:6<32:DACOHD>2.0.ZU;2-H
Abstract
The wafer cleaning procedures used in new semi-conductor manufacturing facilities require extremely high purity chemicals. Delivering chemic als of this quality requires careful management of the chemicals from their manufacturing site to the points of use (POUs) within the wafer fabrication facility (fab). Chemical management includes proper chemic al production, transportation to the wafer fab and design and operatio n of the chemical delivery system within the fab. This paper describes the technology used to supply 15 different types of chemicals to more than 60 POUs in the TECH Semiconductor wafer fab in Singapore. The ce rtification and continuous monitoring program confirms sub-ppb chemica l delivery with particle concentrations of < 3 particles/ml at greater -than-or-equal-to 0.2 mum. Several challenges associated with the init ial design and installation of the chemical delivery system and their resolution are also described.