Dc. Grant et al., DESIGN AND CERTIFICATION OF HIGH-PURITY DELIVERY SYSTEMS FOR SEMICONDUCTOR WAFER CLEANING CHEMICALS, Journal of the IES, 37(6), 1994, pp. 32-40
The wafer cleaning procedures used in new semi-conductor manufacturing
facilities require extremely high purity chemicals. Delivering chemic
als of this quality requires careful management of the chemicals from
their manufacturing site to the points of use (POUs) within the wafer
fabrication facility (fab). Chemical management includes proper chemic
al production, transportation to the wafer fab and design and operatio
n of the chemical delivery system within the fab. This paper describes
the technology used to supply 15 different types of chemicals to more
than 60 POUs in the TECH Semiconductor wafer fab in Singapore. The ce
rtification and continuous monitoring program confirms sub-ppb chemica
l delivery with particle concentrations of < 3 particles/ml at greater
-than-or-equal-to 0.2 mum. Several challenges associated with the init
ial design and installation of the chemical delivery system and their
resolution are also described.