Amorphous carbon films have been prepared by special pulsed vacuum are
depositon methods allowing high currents up to 1 kA and more. The You
ng's modulus of these films has been determined with respect to variou
s technological parameters. For these measurements a method based on t
he propagation of ultrasonic surface waves has been applied which has
been specially designed for the investigation of thin films below one
micrometer. Large changes of the elastic modulus, depending on the tec
hnology, have been observed, contrasting with the common understanding
of invariability of the elastic behaviour. Reflecting the large struc
tural variations possible in amorphous carbon, the elastic modulus rep
resents a suitable parameter for characterizing the carbon-carbon netw
ork. Furthermore, the elastic modulus of amorphous carbon films may be
used for a first estimation of film hardness because of the strong co
rrelation of these two quantities.