The thin film thermal flow process in long trenches is analyzed using
a simulator which solves the equations which govern viscous, incompres
sible fluid flow. The total thermal baking process is divided into sma
ll time steps. At each time step, we solve the governing equations usi
ng the penalty function formulation and the Galerkin finite element me
thod to obtain local velocity vectors. The free surface of the flowing
film is updated according to these local velocity vectors. As an exam
ple application, we simulate the flow of baron and phosphorus doped si
licon dioxide glass films in 2 mu m high by 2 mu m wide, infinitely lo
ng trenches, for which two-dimensional profile evolution is appropriat
e. The simulated film profiles show that the local leveling rate of a
film is a sensitive function of surface curvature. The simulation prog
ram predicts that lower viscosity and thicker films have superior plan
arization properties compared with higher viscosity and thinner films.
These trends are in agreement with empirical observations and previou
s modeling and simulation work on glass film planarization processes.