SOLVING THE INTENSITY PROBLEM OF SURFACE X-RAY-DIFFRACTION USING DYNAMICAL THEORY

Authors
GAU TS CHANG SL
Citation
Ts. Gau et Sl. Chang, SOLVING THE INTENSITY PROBLEM OF SURFACE X-RAY-DIFFRACTION USING DYNAMICAL THEORY, Physics letters. A, 196(3-4), 1994, pp. 223-228
Citations number
25
Categorie Soggetti
Physics
Journal title
Physics letters. A → ACNP
ISSN journal
03759601
Volume
196
Issue
3-4
Year of publication
1994
Pages
223 - 228
Database
ISI
SICI code
0375-9601(1994)196:3-4<223:STIPOS>2.0.ZU;2-7
Abstract
We report for the first time a general way of describing the intensity distribution of the surface X-ray diffraction, especially for specula r and nonspecular surface normal scans along crystal truncation rods ( CTR), using the dynamical theory of X-ray diffraction. New information about the absolute intensity scale, the scattering depth, and the sur face roughness is obtained by considering the interaction of X-ray wav efields in crystals.