Ts. Gau et Sl. Chang, SOLVING THE INTENSITY PROBLEM OF SURFACE X-RAY-DIFFRACTION USING DYNAMICAL THEORY, Physics letters. A, 196(3-4), 1994, pp. 223-228
We report for the first time a general way of describing the intensity
distribution of the surface X-ray diffraction, especially for specula
r and nonspecular surface normal scans along crystal truncation rods (
CTR), using the dynamical theory of X-ray diffraction. New information
about the absolute intensity scale, the scattering depth, and the sur
face roughness is obtained by considering the interaction of X-ray wav
efields in crystals.