THICKNESS DEPENDENCE OF LA2-XSRXCUO4 FILMS

Authors
CIEPLAK MZ BERKOWSKI M GUHA S CHENG E VAGELOS AS RABINOWITZ DJ WU B TROFIMOV IE LINDENFELD P
Citation
Mz. Cieplak et al., THICKNESS DEPENDENCE OF LA2-XSRXCUO4 FILMS, Applied physics letters, 65(26), 1994, pp. 3383-3385
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
65
Issue
26
Year of publication
1994
Pages
3383 - 3385
Database
ISI
SICI code
0003-6951(1994)65:26<3383:TDOLF>2.0.ZU;2-9