A SCANNING TUNNELING MICROSCOPE WITH A PIEZOELECTRIC-DRIVEN INERTIAL SLIDER

We report on a scanning tunneling microscope equipped with a piezoelec tric inertial slider micropositioner. For any orientation, the propose d device allows an approach down to the tunnelling distance from the t ip. The approach process is fully automated by a personal computer tha t generates the driving signals. Continuous motion at a speed of 5 mm s-1 and single-step advancement down to 50 angstrom are obtained. The microscope, due to its mechanical symmetry and rigidity, can operate w ith atomic resolution, using a few stage vibration isolation stacks. T he instrument can easily be modified to operate as an atomic force mic roscope with a fibre-optic-interferometer displacement sensor.