(SiC)(x)(AlN)(1-x) films were grown on (1000) 6H-SiC substrates by MOC
VD. The crystal structures of alloys containing 20 and 80 mol% of AIN
were observed using TEM. The electron diffraction pattern of the forme
r sample shows 2H clusters mixed with cubic structure while the latter
sample shows clearly separated columnary grains of 2H structure.