Td. Senguttuvan et Lk. Malhotra, ELECTRONIC-STRUCTURE OF SOL-GEL DERIVED SNO2 THIN-FILMS, Journal of physics and chemistry of solids, 58(1), 1997, pp. 19-24
Ellipsometric measurements on sol gel derived tin dioxide thin films c
oated onto various substrates (Quartz, Corning 7059, Float glass, Alum
ina and Silicon) have been carried out at air ambient. The imaginary p
arts of dielectric spectra have been analyzed and compared with variou
s theoretically calculated electronic transitions reported in the lite
rature in order to infer the electronic structure of these films. Copy
right (C) 1996 Elsevier Science Ltd