MEASUREMENT OF DIELECTRIC LOSS TANGENT OF ALUMINA AT MICROWAVE-FREQUENCIES AND ROOM-TEMPERATURE

Authors
WOODE RA IVANOV EN TOBAR ME BLAIR DG
Citation
Ra. Woode et al., MEASUREMENT OF DIELECTRIC LOSS TANGENT OF ALUMINA AT MICROWAVE-FREQUENCIES AND ROOM-TEMPERATURE, Electronics Letters, 30(25), 1994, pp. 2120-2122
Citations number
10
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
30
Issue
25
Year of publication
1994
Pages
2120 - 2122
Database
ISI
SICI code
0013-5194(1994)30:25<2120:MODLTO>2.0.ZU;2-H
Abstract
The use of whispering gallery modes allows the dielectric loss tangent of polycrystalline Al2O3 (alumina) to be accurately determined at mic rowave frequencies without the use of a cavity. The dielectric loss ta ngent of alumina is shown to be strongly variable from sample to sampl e with a lowest measured value of 4.3 x 10(-5) observed at 9.0 GHz in a 99.5% alumina sample.