SHORT-PERIOD X-RAY MULTILAYERS BASED ON CR SC

New experimental results on fabrication and investigations of the X-ra y properties of multilayer X-ray mirrors based on Cr/Sc for close-to-n ormal and Brewster's angles of incidence are presented. It is experime ntally shown that the peak reflection coefficient of mirrors with peri ods of 1.6-1.7 nm for the wavelength 3.14 nm reaches 10% at a resoluti on lambda/Delta lambda up to 175. The reflection coefficient of the mi rrors at the Brewster's angle reaches 10-12%. The high reflectivity of the mirrors allows to use them for the creation of multi-mirror schem es for X-ray microscopy and astronomy and X-ray diagnostics of high-te mperature plasma.