CARRIER-DIFFUSION MEASUREMENTS IN SILICON WITH A FOURIER-TRANSIENT-GRATING METHOD

Citation
J. Linnros et V. Grivickas, CARRIER-DIFFUSION MEASUREMENTS IN SILICON WITH A FOURIER-TRANSIENT-GRATING METHOD, Physical review. B, Condensed matter, 50(23), 1994, pp. 16943-16955
Citations number
44
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
50
Issue
23
Year of publication
1994
Pages
16943 - 16955
Database
ISI
SICI code
0163-1829(1994)50:23<16943:CMISWA>2.0.ZU;2-H