M. Dilger et al., TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF GAAS ALGAAS HETEROSTRUCTURES REGROWN ON PATTERNED SUBSTRATES/, Semiconductor science and technology, 9(12), 1994, pp. 2258-2262
The structure of GaAs quantum wires embedded in Al0.33Ga0.67As and the
interfaces between the wires and the matrix were investigated by tran
smission electron microscopy (TEM) in diffraction-contrast and high-re
solution (HREM) modes. The quantum wires were regrown by molecular bea
m epitaxy (MBE) On patterned Al0.33Ga0.67As buffer layers on GaAs subs
trates. Depending on the orientation of the quantum wires within the (
100) surface of the substrate, different characteristic facets develop
during MBE regrowth of the mesa-etched samples. The surface structure
for [011]- and [0 (1) over bar 1]-oriented wires is dominated by (111
) and (311) facets. The (111) planar defects like stacking faults and
twins are frequently observed in the case of (111) facet growth. Mainl
y (110) facet formation is found for [001]- and [010]-oriented wires;
planar defects are not detected in this case.