TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF GAAS ALGAAS HETEROSTRUCTURES REGROWN ON PATTERNED SUBSTRATES/

Citation
M. Dilger et al., TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF GAAS ALGAAS HETEROSTRUCTURES REGROWN ON PATTERNED SUBSTRATES/, Semiconductor science and technology, 9(12), 1994, pp. 2258-2262
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
02681242
Volume
9
Issue
12
Year of publication
1994
Pages
2258 - 2262
Database
ISI
SICI code
0268-1242(1994)9:12<2258:TESOGA>2.0.ZU;2-9
Abstract
The structure of GaAs quantum wires embedded in Al0.33Ga0.67As and the interfaces between the wires and the matrix were investigated by tran smission electron microscopy (TEM) in diffraction-contrast and high-re solution (HREM) modes. The quantum wires were regrown by molecular bea m epitaxy (MBE) On patterned Al0.33Ga0.67As buffer layers on GaAs subs trates. Depending on the orientation of the quantum wires within the ( 100) surface of the substrate, different characteristic facets develop during MBE regrowth of the mesa-etched samples. The surface structure for [011]- and [0 (1) over bar 1]-oriented wires is dominated by (111 ) and (311) facets. The (111) planar defects like stacking faults and twins are frequently observed in the case of (111) facet growth. Mainl y (110) facet formation is found for [001]- and [010]-oriented wires; planar defects are not detected in this case.