QUANTITATIVE MEASUREMENT OF THE STRESS TRANSFER-FUNCTION IN NICKEL POLYIMIDE THIN-FILM COPPER THIN-FILM STRUCTURES/

Citation
L. Schadler et Ic. Noyan, QUANTITATIVE MEASUREMENT OF THE STRESS TRANSFER-FUNCTION IN NICKEL POLYIMIDE THIN-FILM COPPER THIN-FILM STRUCTURES/, Applied physics letters, 66(1), 1995, pp. 22-24
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
66
Issue
1
Year of publication
1995
Pages
22 - 24
Database
ISI
SICI code
0003-6951(1995)66:1<22:QMOTST>2.0.ZU;2-T