NEW POTENTIOMETRY METHOD IN SCANNING-TUNNELING-MICROSCOPY - EXPLOITING THE CORRELATION OF FLUCTUATIONS

Citation
B. Koslowski et C. Baur, NEW POTENTIOMETRY METHOD IN SCANNING-TUNNELING-MICROSCOPY - EXPLOITING THE CORRELATION OF FLUCTUATIONS, Journal of applied physics, 77(1), 1995, pp. 28-33
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
77
Issue
1
Year of publication
1995
Pages
28 - 33
Database
ISI
SICI code
0021-8979(1995)77:1<28:NPMIS->2.0.ZU;2-W