DETECTION OF DEFECTS AT HOMOEPITAXIAL INTERFACE BY DEEP-LEVEL TRANSIENT SPECTROSCOPY

Authors
LU F GONG DW SUN HH WANG X
Citation
F. Lu et al., DETECTION OF DEFECTS AT HOMOEPITAXIAL INTERFACE BY DEEP-LEVEL TRANSIENT SPECTROSCOPY, Journal of applied physics, 77(1), 1995, pp. 213-217
Citations number
6
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
77
Issue
1
Year of publication
1995
Pages
213 - 217
Database
ISI
SICI code
0021-8979(1995)77:1<213:DODAHI>2.0.ZU;2-5