D. Lemoine et al., EFFECT OF CHEMICAL TREATMENTS ON THE COMPOSITION OF HGZNTE SURFACES, Materials science & engineering. B, Solid-state materials for advanced technology, 28(1-3), 1994, pp. 39-42
Results bn the study of the surface of Hg0.85Zn0.15Te show a low segre
gation of its components and a weakly perturbed lattice after simple c
hemical etching processes. The pseudo-dielectric function of this bulk
semiconductor and of its anodic oxide is shown. The density of the in
terface states in the gap is given for several compositions. The stoic
hiometry of the oxidized surface was studied by angle resolved X-ray p
hotoelectron spectroscopy. All results are consistent with a higher bo
nd stability in mercury zinc telluride than mercury cadmium telluride.