OPTICAL AND ELECTRICAL CHARACTERIZATION OF THICK GASB BUFFER LAYERS GROWN ON 2-IN GAAS WAFERS

Citation
F. Royo et al., OPTICAL AND ELECTRICAL CHARACTERIZATION OF THICK GASB BUFFER LAYERS GROWN ON 2-IN GAAS WAFERS, Materials science & engineering. B, Solid-state materials for advanced technology, 28(1-3), 1994, pp. 169-173
Citations number
15
Categorie Soggetti
Material Science","Physics, Condensed Matter
ISSN journal
09215107
Volume
28
Issue
1-3
Year of publication
1994
Pages
169 - 173
Database
ISI
SICI code
0921-5107(1994)28:1-3<169:OAECOT>2.0.ZU;2-#
Abstract
We have investigated the growth of thick, highly uniform GaSb buffer l ayers on 2 in GaAs substrates. We have found that ramping the temperat ure under an arsine flux optimizes the switching sequence between GaAs and GaSb. In this case, the large (about 8%) lattice mismatch which s eparates the Ga-As and Ga-Sb bond lengths is abruptly relaxed, and goo d quality GaSb can be homogeneously deposited. On such samples, the ph otoluminescence signal ranks as well (or even better) as that obtained for comparative homoepitaxial material; also, the electrical properti es are among the best ever reported for GaSb grown by metal-organic ch emical vapor deposition on GaAs.