QUANTITATIVE COMPARISON OF MASS-SPECTROMETRY AND PHOTOLUMINESCENCE ONINASP INP MULTIPLE-QUANTUM-WELL STRUCTURES/

Authors
SCHWEDLER R BRUGGEMANN F JAEKEL C KOHL A BRITTNER S KURZ H
Citation
R. Schwedler et al., QUANTITATIVE COMPARISON OF MASS-SPECTROMETRY AND PHOTOLUMINESCENCE ONINASP INP MULTIPLE-QUANTUM-WELL STRUCTURES/, Materials science & engineering. B, Solid-state materials for advanced technology, 28(1-3), 1994, pp. 319-322
Citations number
8
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Materials science & engineering. B, Solid-state materials for advanced technology → ACNP
ISSN journal
09215107
Volume
28
Issue
1-3
Year of publication
1994
Pages
319 - 322
Database
ISI
SICI code
0921-5107(1994)28:1-3<319:QCOMAP>2.0.ZU;2-R
Abstract
We report a direct comparison of low-temperature photoluminescence spe ctroscopy and sputtered neutral mass spectrometry on an asymmetric InA sP/InP multiple quantum well structure. Distinct luminescence peaks fr om all quantum well layers were observed. They were unambiguously assi gned to individual quantum well layers by subsequent sputter etching s teps. Based on mass spectrometry data, numerical calculations of the l uminescence transitions were performed without any free parameters. Th e consequences of the excellent agreement between the experimental and modelled photoluminescence data are discussed.