STRUCTURE DETERMINATION OF WEAK PHASE OBJECTS FROM INTERFEROMETRIC NEAR-FIELD MEASUREMENTS

Citation
Ma. Krumbugel et M. Totzeck, STRUCTURE DETERMINATION OF WEAK PHASE OBJECTS FROM INTERFEROMETRIC NEAR-FIELD MEASUREMENTS, Applied optics, 33(34), 1994, pp. 7864-7874
Citations number
36
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
33
Issue
34
Year of publication
1994
Pages
7864 - 7874
Database
ISI
SICI code
0003-6935(1994)33:34<7864:SDOWPO>2.0.ZU;2-9
Abstract
Amplitude and phase of diffraction near-fields behind two-dimensional weak phase objects (n approximate to 1.02 + i0.0002) are measured with electromagnetic 3-cm waves in TM and TE polarization. Dielectric slab s and strips with a trapezoidal or rectangular cross section are consi dered (width 1.5 lambda-36.0 lambda; thickness 0.6 lambda-2.4 lambda; wedge angle 30 degrees-150 degrees). For numerical simulation of the m easured fields, a modification of the first Born approximation for wea k scatterers is developed, which yields a remarkably better agreement with the measurements but requires no higher numerical efforts than th e first Born approximation. Procedures for the determination of width, thickness, and wedge angle of the objects from measured diffraction f ields are presented.