TOTAL, DOSE AND PROTON TESTING OF A COMMERCIAL HGCDTE ARRAY

Authors
HOPKINSON GR BADDILEY CJ GUY DRP PARSONS JE
Citation
Gr. Hopkinson et al., TOTAL, DOSE AND PROTON TESTING OF A COMMERCIAL HGCDTE ARRAY, IEEE transactions on nuclear science, 41(6), 1994, pp. 1966-1973
Citations number
14
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
41
Issue
6
Year of publication
1994
Part
1
Pages
1966 - 1973
Database
ISI
SICI code
0018-9499(1994)41:6<1966:TDAPTO>2.0.ZU;2-7
Abstract
The radiation tolerance of a commercially available 256x4 HgCdTe array has been measured. The main effects were ionization-induced and produ ced changes in diode slope resistance and CMOS multiplexer characteris tics (particularly the onset of parasitic leakage currents after simil ar to 15krad(Si). However these effects annealed with storage above 20 degrees C.