Gr. Srinivasan et al., PARAMETER-FREE, PREDICTIVE MODELING OF SINGLE EVENT UPSETS DUE TO PROTONS - NEUTRONS, AND PIONS IN TERRESTRIAL COSMIC-RAYS, IEEE transactions on nuclear science, 41(6), 1994, pp. 2063-2070
In this paper we present a new approach and a computer software for mo
deling single event upsets. This model, named Soft Error Montecarlo Mo
del (SEMM), does not need any experimental inputs or any parameter fit
ting. It is intended to be a design tool for chip designers when they
want to optimize their designs for soft error hardness and performance
. The paper focuses on terrestrial cosmic rays that cause single event
upsets. Details of the nuclear modeling and of the coupled device-cir
cuit modeling are presented. Also presented are the comparison of SEMM
predictions against measurements of single event upset rate in proton
beam experiments and in computer main frame field tests performed at
high ground elevations. We also present some proton-pion comparisons t
hat are relevant to single event upsets.