SINGLE EVENT EFFECTS IN ANALOG-TO-DIGITAL CONVERTERS - DEVICE PERFORMANCE AND SYSTEM IMPACT

Authors
TURFLINGER TL DAVEY MV MAPPES BM
Citation
Tl. Turflinger et al., SINGLE EVENT EFFECTS IN ANALOG-TO-DIGITAL CONVERTERS - DEVICE PERFORMANCE AND SYSTEM IMPACT, IEEE transactions on nuclear science, 41(6), 1994, pp. 2187-2194
Citations number
5
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
41
Issue
6
Year of publication
1994
Part
1
Pages
2187 - 2194
Database
ISI
SICI code
0018-9499(1994)41:6<2187:SEEIAC>2.0.ZU;2-1
Abstract
Monolithic Analog-to-Digital Converters (ADCs) exhibit a large error r ate in the single event effects (SEE) environment. Analysis of data fr om a high-performance ADC demonstrates the type of errors and their po tential impact on system performance.