SINGLE EVENT UPSET AND CHARGE COLLECTION MEASUREMENTS USING HIGH-ENERGY PROTONS AND NEUTRONS

Citation
E. Normand et al., SINGLE EVENT UPSET AND CHARGE COLLECTION MEASUREMENTS USING HIGH-ENERGY PROTONS AND NEUTRONS, IEEE transactions on nuclear science, 41(6), 1994, pp. 2203-2209
Citations number
27
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
ISSN journal
00189499
Volume
41
Issue
6
Year of publication
1994
Part
1
Pages
2203 - 2209
Database
ISI
SICI code
0018-9499(1994)41:6<2203:SEUACC>2.0.ZU;2-Y
Abstract
RAMs, microcontrollers and surface barrier detectors were exposed to b eams of high energy protons and neutrons to measure the induced number of upsets as well as energy deposition. The WNR facility at Los Alamo s provided a neutron spectrum similar to that of the atmospheric neutr ons. Its effect on devices was compared to that of protons with energi es of 200, 400, 500 and 800 MeV. Measurements indicate that SEU cross sections for 400 MeV protons are similar to those induced by the atmos pheric neutron spectrum.