A NEW PROCEDURE FOR STATIC RAM EVALUATION UNDER X-RAY PULSES

Citation
R. Marec et al., A NEW PROCEDURE FOR STATIC RAM EVALUATION UNDER X-RAY PULSES, IEEE transactions on nuclear science, 41(6), 1994, pp. 2467-2473
Citations number
3
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
ISSN journal
00189499
Volume
41
Issue
6
Year of publication
1994
Part
1
Pages
2467 - 2473
Database
ISI
SICI code
0018-9499(1994)41:6<2467:ANPFSR>2.0.ZU;2-4
Abstract
An original method, to identify the initial patterns that are the most favourable to obtain upsets under X-ray pulses, has been developed on Static RAMs in the standby mode. The results obtained with these init ial patterns are interesting in order to analyse the radiation induced failures.