LAMINAR ANALYSIS OF THIN-FILM SAMPLES BY THE MASS-SPECTROMETRY TECHNIQUE OF SECONDARY IONS WITH ADDITIONAL REGISTRATION OF CURRENT SAMPLE

Authors
TOLSTOGUZOV AB KITAEVA TI
Citation
Ab. Tolstoguzov et Ti. Kitaeva, LAMINAR ANALYSIS OF THIN-FILM SAMPLES BY THE MASS-SPECTROMETRY TECHNIQUE OF SECONDARY IONS WITH ADDITIONAL REGISTRATION OF CURRENT SAMPLE, Pis'ma v Zurnal tehniceskoj fiziki, 20(16), 1994, pp. 37-39
Citations number
6
Categorie Soggetti
Physics, Applied
Journal title
Pis'ma v Zurnal tehniceskoj fiziki → ACNP
ISSN journal
03200116
Volume
20
Issue
16
Year of publication
1994
Pages
37 - 39
Database
ISI
SICI code
0320-0116(1994)20:16<37:LAOTSB>2.0.ZU;2-P