A Ti-B-N film has been obtained by two methods, which are EB-ion plati
ng and N ion bombardment of a Ti-B film. TEM micrograph shows that the
Ti-B-N film has a dense nano-crystalline structure. X-ray and electro
n diffraction indicate that the Ti-B-N film consists of fee TiN with d
ispersed simple orthorhombic TiB, cubic BN and simple hexagonal Ti-B-N
phases. The deposition temperature can be lowered to obtain Ti-B-N fi
lm by N ion bombardment. AES depth profile analysis indicates that the
N ion bombardment extends interfacial diffusion zone. Scratch test re
sults show that the N ion bombardment increases the film-to-substrate
adhesion.