REAL-TIME ANALYSIS OF DIFFRACTION PATTERNS, AT EXTREMELY LOW-LIGHT LEVELS

By analyzing previous experiments with statistically independents phot ons, just one concerns the diffraction pattern; it was revealed with p hotographic technique. The present describes an experiment which produ ces a diffraction pattern at very low intensity radiation consisting o f statistically independent photons. This pattern was revealed in real time by using image intensification. Several photodetection arrangeme nts utilizing image intensifier tubes and image storage devices have b een tested and the results presented. This study involved the evaluati on of the error probability in photons overlap at any rims. The linear ity dependence between light intensity and bright pattern diffraction was verified.