OH-RELATED CAPACITANCE-VOLTAGE RECOVERY EFFECT IN MOS CAPACITORS PASSIVATED BY PBO-B2O3-SIO2-AL2O3 GLASSES .3. THE EFFECTS OF PBO CONTENT

Authors
KOBAYASHI K MIZUSHIMA I
Citation
K. Kobayashi et I. Mizushima, OH-RELATED CAPACITANCE-VOLTAGE RECOVERY EFFECT IN MOS CAPACITORS PASSIVATED BY PBO-B2O3-SIO2-AL2O3 GLASSES .3. THE EFFECTS OF PBO CONTENT, Journal of materials science letters, 13(24), 1994, pp. 1764-1766
Citations number
14
Categorie Soggetti
Material Science
Journal title
Journal of materials science letters → ACNP
ISSN journal
02618028
Volume
13
Issue
24
Year of publication
1994
Pages
1764 - 1766
Database
ISI
SICI code
0261-8028(1994)13:24<1764:OCREIM>2.0.ZU;2-T