SECONDARY-ION MASS-SPECTROMETRIC STUDIES OF SRTIO3, BUFFERING EFFECT ON (PB1-XLAX)(ZR1-YTIY)(1-X 4)O-3 THIN-FILMS PREPARED BY PULSED-LASER DEPOSITION/

Citation
Yc. Ling et al., SECONDARY-ION MASS-SPECTROMETRIC STUDIES OF SRTIO3, BUFFERING EFFECT ON (PB1-XLAX)(ZR1-YTIY)(1-X 4)O-3 THIN-FILMS PREPARED BY PULSED-LASER DEPOSITION/, Applied physics letters, 66(2), 1995, pp. 156-158
Citations number
25
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
66
Issue
2
Year of publication
1995
Pages
156 - 158
Database
ISI
SICI code
0003-6951(1995)66:2<156:SMSOSB>2.0.ZU;2-S