THE ROLE OF SIGMA-5 COINCIDENCE BOUNDARIES IN THE GROWTH SELECTION OFFE-3-PERCENT SI

Texture data, obtained by X-ray diffraction, is used to determine the CSL. (Sigma) statistics relating grain orientations in primary recryst allized and secondary recrystallized conventional gain oriented (CGO) 3% silicon steel. The CSL (Sigma) statistics indicate that Sigma 5, Si gma 13a, and Sigma 17a coincidence boundaries appear in significant qu antities. Using the information gathered from the CSL (Sigma) statisti cs, the Sigma 5 operator is chosen to perform orientation transformati ons calculating primary and secondary recrystallization textures, good agreement being found between the experimental and the calculated tex tures. It appears that the amount of available Sigma 5 coincidence bou ndaries, relating the grains in the primary recrystallized and those i n the secondary recrystallized material, influences the sharpness of t he final Goss texture. It is found also that using the Sigma 5 operato r the main features of the 'desirable primary recrystallization textur e' that give a sharp Goss texture can be determined.