HOW DO HOT CARRIERS DEGRADE N-CHANNEL MOSFETS

Authors
MISTRY K DOYLE B
Citation
K. Mistry et B. Doyle, HOW DO HOT CARRIERS DEGRADE N-CHANNEL MOSFETS, IEEE circuits and devices magazine, 11(1), 1995, pp. 28-33
Citations number
8
Categorie Soggetti
Instument & Instrumentation","Engineering, Eletrical & Electronic
Journal title
IEEE circuits and devices magazine → ACNP
ISSN journal
87553996
Volume
11
Issue
1
Year of publication
1995
Pages
28 - 33
Database
ISI
SICI code
8755-3996(1995)11:1<28:HDHCDN>2.0.ZU;2-W