Ls. Kokhanchik, SPECIAL FEATURES OF THE SCANNING ELECTRON-MICROSCOPE TECHNIQUE FOR INVESTIGATION OF FERROELECTRIC-CRYSTALS, Industrial laboratory, 60(7), 1994, pp. 402-405
On the basis of experimental work an unconventional methodological app
roach to the visualization conditions of a domain structure is propose
d. To observe domains and their boundaries by the scanning electron mi
croscope (SEM) technique, the method of specimen surface charging by a
n electron probe is used. This approach has been substantiated in inve
stigations of the ferroelectrics BaTiO3, Pb5Ge3O11, and LiNbO3. The me
thodological aspects of the measurement of some parameters of ferroele
ctric objects with the use of the SEM method (the charge potential rel
ief for estimating a local change in conductivity, the coefficient of
secondary emission in different domains) are discussed. Some in situ e
xperiments have been carried out, such as repolarization under a beam
and investigation of the interrelation between the potential image of
domains and the pyroelectric properties of materials.