SELECTIVE EPITAXIAL-GROWTH OF GAINP BY LP-MOCVD USING ETHYLDIMETHYLINDIUM, TRIMETHYLINDIUM, TRIMETHYLGALLIUM AND TRIETHYLGALLIUM AS GROUP-III SOURCES

Citation
Sh. Chan et al., SELECTIVE EPITAXIAL-GROWTH OF GAINP BY LP-MOCVD USING ETHYLDIMETHYLINDIUM, TRIMETHYLINDIUM, TRIMETHYLGALLIUM AND TRIETHYLGALLIUM AS GROUP-III SOURCES, Applied surface science, 82-3, 1994, pp. 85-90
Citations number
8
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
82-3
Year of publication
1994
Pages
85 - 90
Database
ISI
SICI code
0169-4332(1994)82-3:<85:SEOGBL>2.0.ZU;2-E
Abstract
The present experiments demonstrate the epitaxial growth (EG) and sele ctive epitaxial growth (SEG) of GaInP by low-pressure metalorganic che mical vapor deposition (LP-MOCVD) using ethyldimethylindium (EDMI), tr imethylindium (TMI), trimethylgallium (TMG) and triethylgallium (TEG) as group III sources. In epitaxial growth of GaInP, the Ga incorporati on efficiency using TEG+EDMI is found to be lower than those using oth er combinations. Completely selective epitaxy using TEGa + EDMIn can b e achieved at a growth temperature of 675-degrees-C and at a growth pr essure of 40 Torr, while other combinations (TEG + TMI, TMG + TMI, and TMG + EDMI) can achieve SEG of GaInP at 650-degrees-C. High resolutio n double-crystal X-ray measurements are used to investigate the compos itional variation in the selectively epitaxial-grown area.