PHOTOREFLECTANCE AND ELECTROREFLECTANCE SPECTRA FROM SPATIALLY INHOMOGENEOUS HETEROSTRUCTURES CALCULATED BY MEANS OF A NEW METHOD

Authors
BELIAEV D ENDERLEIN R SOARES JANT SCOLFARO LMR CESCHIN AM QUIVY AA LEITE JR
Citation
D. Beliaev et al., PHOTOREFLECTANCE AND ELECTROREFLECTANCE SPECTRA FROM SPATIALLY INHOMOGENEOUS HETEROSTRUCTURES CALCULATED BY MEANS OF A NEW METHOD, Superlattices and microstructures, 15(3), 1994, pp. 339-343
Citations number
9
Categorie Soggetti
Physics, Condensed Matter
Journal title
Superlattices and microstructures → ACNP
ISSN journal
07496036
Volume
15
Issue
3
Year of publication
1994
Pages
339 - 343
Database
ISI
SICI code
0749-6036(1994)15:3<339:PAESFS>2.0.ZU;2-H
Abstract
The problem of calculating photo- and electro-reflectance spectra from weakly inhomogeneous layers of semiconductor heterostructures is solv ed by combining two former approaches; the transfer matrix method and the perturbation theoretical treatment of the weak inhomogeneity. The electric field profile and its perturbation by pump light is calculate d from an integral equation. The method is applied to several heterost ructures based on (Ga,Al)As. Due to its speed and accuracy the method is capable of online simulation of PR and ER spectra.