SURFACE-CHEMISTRY AND TIP SAMPLE INTERACTIONS IN ATOMIC-FORCE MICROSCOPY

Citation
Tj. Senden et Cj. Drummond, SURFACE-CHEMISTRY AND TIP SAMPLE INTERACTIONS IN ATOMIC-FORCE MICROSCOPY, Colloids and surfaces. A, Physicochemical and engineering aspects, 94(1), 1995, pp. 29-51
Citations number
116
Categorie Soggetti
Chemistry Physical
ISSN journal
09277757
Volume
94
Issue
1
Year of publication
1995
Pages
29 - 51
Database
ISI
SICI code
0927-7757(1995)94:1<29:SATSII>2.0.ZU;2-V
Abstract
Microfabricated silicon nitride cantilevers with integral tips are com monly employed in atomic force microscopy. The link between surface ch emistry, including surface group acid-base dissociation and counterion complexation, and tip-sample interaction in aqueous electrolyte solut ion is examined. Silicon nitride tip interaction with ''flat plate'' s amples of both muscovite mica and silicon nitride as a function of aqu eous solution pH and electrolyte concentration is investigated. The lo ng-range component of the interaction is normalized with respect to an effective tip radius, and as a result electrical double layer and van der Waals interactions can be discussed quantitatively. Microfracture and tribochemical tip wear is also discussed with reference to atomic force microscope contact mode imaging. Non-retarded Hamaker constants are reported for a range of silicon nitride, silica, silicon and musc ovite mica systems.