The growth and structure of Cr films (0-30 nominal monolayers (ML)) on
Cu(001) held at room temperature have been investigated by photoemiss
ion, photoelectron diffraction and low energy electron diffraction tec
hniques. The films exhibit ordered body-centred cubic (bcc) domains ty
pically similar to 10 lattice parameters in size with Cr(110)parallel
to(Cu(001) and Cr[1<($$)over bar>11]parallel to Cu[110] and equivalent
epitaxial orientations. LEED and photoelectron diffraction reveal a s
ubstantial deviation from relaxed bce structure in ultra-thin films (<
3 ML) with an in-plane distortion and expansion and an interlayer cont
raction of the Cr(110) layers. The initial mode of growth is character
ized by the formation of multilayer islands and 90% substrate coverage
occurs by similar to 4 ML.