PHOTOELECTRIC PHENOMENA IN SEMICONDUCTOR- DIELECTRIC THIN-LAYER INTERFACE STRUCTURE ON HIGH OHMIC PURE-CRYSTALS

Authors
KASHERININOV PG KICHAEV AV TOMASOV AA YAROSHETSKII ID
Citation
Pg. Kasherininov et al., PHOTOELECTRIC PHENOMENA IN SEMICONDUCTOR- DIELECTRIC THIN-LAYER INTERFACE STRUCTURE ON HIGH OHMIC PURE-CRYSTALS, Pis'ma v Zurnal tehniceskoj fiziki, 20(18), 1994, pp. 16-21
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
Pis'ma v Zurnal tehniceskoj fiziki → ACNP
ISSN journal
03200116
Volume
20
Issue
18
Year of publication
1994
Pages
16 - 21
Database
ISI
SICI code
0320-0116(1994)20:18<16:PPISDT>2.0.ZU;2-L