SPECIFIC CONTACT RESISTANCE MEASUREMENTS OF OHMIC CONTACTS TO SEMICONDUCTING DIAMOND

Authors
HEWETT CA TAYLOR MJ ZEIDLER JR GEIS MW
Citation
Ca. Hewett et al., SPECIFIC CONTACT RESISTANCE MEASUREMENTS OF OHMIC CONTACTS TO SEMICONDUCTING DIAMOND, Journal of applied physics, 77(2), 1995, pp. 755-760
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
77
Issue
2
Year of publication
1995
Pages
755 - 760
Database
ISI
SICI code
0021-8979(1995)77:2<755:SCRMOO>2.0.ZU;2-5